8. Concluding Remarks
Preliminary fictitious data tests indicate that the proposed
approach is promising. Even though the method was origi-
nally developed for data reduction in close-range non-metric
photography, it can be used with distinct advantages in con-
junction with close-range metric photography. Experiments
with real data are underway, and it is planned to report on
these tests in the near future.
9. References
1. Hallert, Bertil, 1960.
Photogrammetry: Basic Principles and Gener-
al Survey
, McGraw-Hill, Inc., London, 340 p.
2. von Gruber, 0. (editor), 1930.
Ferienkurs in Photogrammetrie
, Ver-
lag von Konrad Wittwer, Stuttgart, Germany, 510 p.
This article originally appeared as:
Abdel-Aziz, Y.I. and H.M. Karara, 1971. Direct Linear Transformation
from Comparator Coordinates into Object Space Coordinates in
Close-Range Photogrammetry,
Proceedings of the Symposium
on Close-Range Photogrammetry
, 26–29 January 1971, Urbana,
Illinois, pp. 1—18.
This article has been reproduced exactly as originally
published, with minor text corrections and formatting
errors fixed.
Youssef Ibrahim Abdel-Aziz
was born in Cairo, Egypt in
1940. He earned his B.Sc. degree in mining engineering
from Cairo University in 1963. He was them employed as a
teaching assistant in civil engineering (surveying) in Cairo,
Alexandria, Assiut universities in Egypt. In 1967 he earned
his Master’s degree in civil engineering (photogrammetry)
from Cairo University. Since 1968, Mr. Abdel-Aziz has been
pursuing graduate studies in photogrammetric and geodetic
engineering at the University of Illinois, concurrent with
his employment as a research assistant. Mr. Abdel-Aziz was
awarded University of Illinois’ fellowships in 1969-1970 and
again in 1970–71.
H.M. “Sam” Karara
is a professor of Civil Engineering at
the University of Illinois in Urbana where he is in charge of
the area of Photogrammetric and Geodetic Engineering. He
received his bachelor’s degree in Civil Engineering from Cairo
University, Egypt in 1949 and his doctoral degree in Geodetic
Science from the Swiss Federal Institute of Technology in
Zurich, Switzerland in 1956. He is a registered professional
engineer in Illinois, and is a member of numerous technical
and professional societies, including ASP, ACSM, ASCE.
Currently he is the U.S. representative on Commission V
(Nontopographic Applications) of the International Society
for Photogrammetry and chairman of the Special Applications
Committee of the Photogrammetric Surveys Division of the
American Society for Photogrammetry.
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